Advanced Topics

Measuring Anisotropic Particles: Techniques for analyzing particles that are not spherical, providing information about their shape and orientation.

Combining DLS with Other Techniques: Using DLS in conjunction with X-ray scattering, electron microscopy, and other methods to obtain comprehensive data about particle size and structure.

Developments in DLS Technology: Recent advancements in instrumentation and software that improve the sensitivity, accuracy, and range of DLS measurements.